Characterization (Nanomaterials and nanodevices)

[List of equipements]

 

Nanomaterial characterization:

- Nuclear microanalysis station (RBS et ERD)

- X-ray Photoelectron Spectroscopy (XPS), VG Escalab 220i XL

- X-ray Diffraction (XRD), Panalytical X-Pert PRO MRD

- X-ray Diffraction (XRD), Bruker D8 Advance  

 

Microscopy:

- Scanning Probe Microscope (AFM / STM), Veeco Multimode (Digital Instruments)

- Scanning Probe Microscope (AFM), Veeco Enviroscope (Digital Instruments)

- Ultra-High Vacuum Scanning Probe Microscope (SPM), Jeol 4500 UHV AFM/STM

- Variable Temperature UHV STM / AFM Scanning Probe Microscope (SPM) , Omicron Nanotechnology VT UHV STM / AFM

- Atomic Force Microscope (AFM), XE-150 (Park Systems)

- Scanning Electron Microscope (SEM), Jeol JSM-6300F

- Scanning Electron Microscope (SEM), Jeol JSM-7401F

- Optical Microscope, Nikon Eclipse L200

- Profilometer, Ambios XP2

 

Nanodevices - Optical characterization:

- Electro-optical characterization of materials

- Optical pulse shaping and characterization

- Linear and non-linear characterization of nanophotonic devices

- Ellipsometer, J.A. Woolam M-2000

- Ellipsometer, J.A. Woolam VVASE

- Prism coupler, Metricon 2010/M  

 

Nanodevices - Electrical characterization:

- Wire-bonder, KS4523

- Probe Station, Alessi 4500

- Probe Station, Cascades Summit 11000